000 | 00398nam a2200145Ia 4500 | ||
---|---|---|---|
008 | 190516s9999 xx 000 0 und d | ||
100 |
_aAlven, William H. Von _917337 |
||
245 | 0 |
_aSemiconductor Reliability _cVolume 2 |
|
260 |
_bEngineering Publishers _c1962 _aNew Jersey |
||
300 | _a400 | ||
600 |
_tPhysics _91741 |
||
650 |
_aPhysics _91741 |
||
942 | _cBK | ||
999 |
_c118957 _d118957 |