000 00398nam a2200145Ia 4500
008 190516s9999 xx 000 0 und d
100 _aAlven, William H. Von
_917337
245 0 _aSemiconductor Reliability
_cVolume 2
260 _bEngineering Publishers
_c1962
_aNew Jersey
300 _a400
600 _tPhysics
_91741
650 _aPhysics
_91741
942 _cBK
999 _c118957
_d118957